Silicon Drift Detector Beryllium Window
Silicon Drift Detector (SDD) is an advanced type of semiconductor detector widely used in X-ray and particle detection, particularly in energy spectrum analysis (such as EDS/EDX), synchrotron radiation, nuclear physics, and other fields.
Silicon Drift Detector Beryllium Window
Silicon Drift Detector (SDD) is an advanced type of semiconductor detector widely used in X-ray and particle detection, particularly in energy spectrum analysis (such as EDS/EDX), synchrotron radiation, nuclear physics, and other fields.
Basic Principle
The SDD operates on the principle of lateral electric field drift, which allows electrons to drift along electric field lines from the point of generation to a small-area anode. This design reduces capacitance, enabling higher resolution, lower noise, and faster energy analysis.
Key Features
| Feature | Description |
|---|---|
| High Energy Resolution | Typically achieves 125–140 eV (for Mn Kα line), superior to traditional Si-PIN detectors |
| High Counting Rate Capability | Suitable for high-throughput applications, handling input count rates >1 Mcps |
| Low-Noise Design | Small anode structure reduces capacitance, effectively lowering electronic noise |
| Wide Energy Range | Capable of detecting X-rays from 0.1 keV to several tens of keV |
| Thermoelectric Cooling | Most SDDs use Peltier cooling, eliminating the need for liquid nitrogen |
| Reliable and Stable | Suitable for long-term measurements with high sensitivity and excellent stability |
Common Applications
-
X-ray Fluorescence (XRF)
-
Energy Dispersive Spectroscopy (EDS/EDX)
-
Synchrotron Radiation
-
Particle Physics
-
Material Science
-
Semiconductor Analysis
Additional Notes
Compared to traditional Si-PIN detectors, SDDs are more advanced, offering faster data processing and better energy resolution. As a result, they have largely replaced Si-PIN detectors in modern electron microscopes and high-end analytical instruments.
|
Item |
Specification |
|
Product Name |
Beryllium Window Brazed Assembly |
|
Window Diameter |
7 mm (Customizable) |
|
Thickness |
0.025 mm (Thinnest 0.012mm) |
|
Temperature Resistance |
Up to 350°C (max 400°C under vacuum) |
|
Cap |
Stainless steel / Nickel steel |
|
Leakage Rate |
≤ 1.0 × 10⁻¹⁰ Pa·m³/sec |
|
Remarks |
Thin beryllium foil; can be baked at 400°C in vacuum. For atmospheric use, do not exceed 350°C. Custom non-standard flange shapes available upon request. |